Hussein, H. A. <br/><br/>
Genetic analysis of earliness and grain yield traits in two wheat crosses  [electronic resource]. 
 التحليل الوراثى لصفات التبكير و صفات محصول الحبوب فى هجينين من القمح 

 - p.371-381. 
<br/><br/>Includes references. 
<br/><br/> The six parmeter model was used to determine the intra- and inter-allelic gene interactions controlling the inheritance of earliness and yield traits in two crosses of wheat (cross I: Saunval X Line 126; cross II: Gemmeiza 9X Sids 4).Analysis of variance indicated that significant differences existed among generations i.e P1, P2, F1, F2, BC1 and BC2 for all studied traits in both crosses. 
<br/><br/><br/>Summary in Arabic. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Wheat--Breeding.<br/>Wheat--Yields.<br/>Wheat--Genetics.