Forecasting growth characteristics and yield of cotton from spectral reflectance data [electronic resource].
Language: English Summary language: Arabic Description: p.585-605Other title:- توقع صفات النمو وانتاجية محصول القطن من بيانات الانعكاس الطيفى [Added title page title]
- Annals of agricultural science, 2003 v. 48 (2) [electronic resource].
Includes references.
The present investigation was undertaken during 2001 and 2002 growing seasons to study the effect of two sowing dates on spectral reflectance during growth stages of cotton plants. The spectral reflectance was measured by radiometer instrument (Spectron SE 590) in four wavelength bands (IM1 = 0.45 to 0.52 um, TM2 = 0.52 to 0.60 um, TM3 = 0.63 to 0.69 um and TM4 = 0.76 to 0.90 um) and derived the Normalized Difference Vegetation Index (NDVI) from these band values as follows: NDVI = (TM4 - TM3) / (TM4 + TM3). The growth characteristics, i.e. chlorophyll concentration of leaves, fresh weight of biomass and leaf area index (LAI) were measured.
Summary in Arabic.
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